CHOURASIA, A. R.; 						PEARSON, Justin Seth.
 Investigation of Diffusion at the Cu/Hf Interface by X-ray Photoelectron Spectroscopy.
<strong>Quarterly Physics Review</strong>, [S.l.], v. 4, n. 2, apr. 2018.
ISSN 2572-701X.
Available at: &lt;<a href="https://esmed.org/MRA/qpr/article/view/1717" target="_new">https://esmed.org/MRA/qpr/article/view/1717</a>&gt;. Date accessed: 18 apr. 2024.
doi: <a href="https://doi.org/10.18103/qpr.v4i2.1717">https://doi.org/10.18103/qpr.v4i2.1717</a>.